The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...
For materials scientists, understanding the atomic structure of a material, revealing defects, or characterizing the chemical and physical processes that occur during the creation of material, are key ...
TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...
Prepare samples by coating, drying, etching, milling, polishing, and sectioning. The Leica CPD 030 Critical Point Dryer is a critical point drying device for biological and industrial samples. It uses ...
In the single-beam FIB, such as our Hitachi FB-2000A FIB, some milling will occur during observation of the specimen. Surface features, such as thin films, can be milled away during this process. In ...
Cryo-electron microscopy (cryo-EM) can help scientists determine the three-dimensional structure of proteins in unprecedented detail. Jacques Dubochet, former group leader at EMBL, shared the 2017 ...