Synopsys Inc. today announced it has upgraded its design-for-test (DFT) and automatic test pattern generation (ATPG) products for system-on-a-chip (SOC) design flow. The upgrades to the company’s ...

SAN MATEO, Calif.—Synopsys Inc. Monday (March 3) announced it has added new features to SoCBIST, an add-on to DFT Compiler for the creation and integration of IP cores that are optimized for test ...

A series of design-for-test (DFT) and automatic pattern generation (ATPG) products leverage advanced test modeling for dramatic capacity and performance gains in Synopsys' DFT Compiler. The TetraMAX ...

Logic BIST Capability Slashes Test Costs By fortifying the DFT Compiler with deterministic logic built-in self-test (BIST) capabilities, the SoCBIST add-on module significantly cuts test cost by ...

In both of the above cases the outcome will be a file having Test Point type and location where it has to be inserted (along with other relevant information dependent on tool eg. probable equivalent ...

Synopsys has extended its DFT compiler tool allowing it to add built-in self test (BIST) circuitry to system-on-chip (SoC) designs. Registers added by the SoCBIST tool are not as extensive as full ...

SocBIST Delivers Identical Fault Coverage with 10 Times Reduction in Test Time and 400 Times Reduction in Data Volume Compared to Full Scan MOUNTAIN VIEW, Calif., September 30, 2002 - Synopsys, Inc.

MOUNTAIN VIEW, USA: Synopsys Inc. announced that Synopsys' DFT MAX compression product has been successfully deployed at more than one hundred semiconductors companies from all industry segments to ...