When you “snap” a photo with a point-and-shoot camera or a cell phone, you hope to obtain a blemish-free image. The makers of CMOS image sensors used in these and other electronic products have a ...
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Image-based model enhances the detection of surface defects in low-light industrial settings
In industry, the detection of anomalies such as scratches, dents, and discolorations is crucial to ensure product quality and safety. However, conventional methods rely on heavy computational ...
Two questions asked in this paper were: is the measurement by 4D InSpec equivalent on the original surface in respect to a replica, that is, how similar are the results? And: under what circumstances ...
The use of design-based care areas on inspection tools [1, 2] to characterize defects has been well established in recent years. However, the implementation has generally been limited to specific ...
Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...
Researchers have designed a robust image-based anomaly detection (AD) framework with illumination enhancement and noise suppression features that can enhance the detection of subtle defects in ...
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